Influence of defect reduction and strain relaxation on carrier dynamics in InGaN-based light-emitting diodes on cone-shaped patterned sapphire substrates

Kyu-Seung Lee, Yang-Seok Yoo, Jae-Hoon Lee, Yong-Chun Kim, Yong-Hoon Cho, Isnaeni
  • Journal of Applied Physics, May 2013, American Institute of Physics
  • DOI: 10.1063/1.4803515
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