Erratum: “Grain boundary diffusivity of Ni in Au thin films and the associated degradation in electrical contact resistance due to surface oxide film formation” [J. Appl. Phys. 113, 114906 (2013)]

N. Argibay, M. T. Brumbach, M. T. Dugger, P. G. Kotula
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4803125