Erroneous p-type assignment by Hall effect measurements in annealed ZnO films grown on InP substrate

R. Macaluso, M. Mosca, C. Calì, F. Di Franco, M. Santamaria, F. Di Quarto, J.-L. Reverchon
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4803080