Electrostatic properties of few-layer MoS2 films

Guolin Hao, Zongyu Huang, Yundan Liu, Xiang Qi, Long Ren, Xiangyang Peng, Liwen Yang, Xiaolin Wei, Jianxin Zhong
  • AIP Advances, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4802921
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