Full field electron spectromicroscopy applied to ferroelectric materials

N. Barrett, J. E. Rault, J. L. Wang, C. Mathieu, A. Locatelli, T. O. Mentes, M. A. Niño, S. Fusil, M. Bibes, A. Barthélémy, D. Sando, W. Ren, S. Prosandeev, L. Bellaiche, B. Vilquin, A. Petraru, I. P. Krug, C. M. Schneider
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4801968
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