Nanoscale interaction layer at the interface between Al films and SiO2 substrates of Al/AlOx/Al Josephson tunnel junctions

L. J. Zeng, T. Greibe, S. Nik, C. M. Wilson, P. Delsing, E. Olsson
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4801798
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