Defect-induced performance degradation of 4H-SiC Schottky barrier diode particle detectors

N. Iwamoto, B. C. Johnson, N. Hoshino, M. Ito, H. Tsuchida, K. Kojima, T. Ohshima
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4801797