X-ray photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors

A. J. Nelson, L. F. Voss, P. R. Beck, R. T. Graff, A. M. Conway, R. J. Nikolic, S. A. Payne, J.-S. Lee, H. Kim, L. Cirignano, K. Shah
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4801793
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