Use of ordered mesoporous SiO2 as protection against thermal disturbance in phase-change memory

  • Tae-Jung Ha, Sangwoo Shin, Hyung Keun Kim, Min-Hee Hong, Chang-Sun Park, Hyung Hee Cho, Doo Jin Choi, Hyung-Ho Park
  • Applied Physics Letters, April 2013, American Institute of Physics
  • DOI: 10.1063/1.4801476

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http://dx.doi.org/10.1063/1.4801476

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