Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress

Chunhyung Jo, Sungwoo Jun, Woojoon Kim, Inseok Hur, Hagyoul Bae, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4800172
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