Characterization and suppression of low-frequency noise in Si/SiGe quantum point contacts and quantum dots

  • K. Takeda, T. Obata, Y. Fukuoka, W. M. Akhtar, J. Kamioka, T. Kodera, S. Oda, S. Tarucha
  • Applied Physics Letters, March 2013, American Institute of Physics
  • DOI: 10.1063/1.4799287

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http://dx.doi.org/10.1063/1.4799287

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