Dielectric properties of stoichiometric and defect-induced hydroxyapatite

N. Horiuchi, J. Endo, N. Wada, K. Nozaki, M. Nakamura, A. Nagai, K. Katayama, K. Yamashita
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4799130