Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc

E. Carvou, J. L. Le Garrec, J. Pérez, J. Praquin, M. Djeddi, J. B. A. Mitchell
  • AIP Advances, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4799061