Bias stress effect in polyelectrolyte-gated organic field-effect transistors

  • H. Sinno, S. Fabiano, X. Crispin, M. Berggren, I. Engquist
  • Applied Physics Letters, March 2013, American Institute of Physics
  • DOI: 10.1063/1.4798512

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1063/1.4798512

In partnership with:

Link to American Institute of Physics showcase