Reducing thickness dependence of critical current density in GdBa2Cu3O7−δ thin films by addition of nanostructured defects

D. H. Tran, W. B. K. Putri, B. Kang, N. H. Lee, W. N. Kang, W. K. Seong
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4798233