Contact resistance improvement by dielectric breakdown in semiconductor-dielectric-metal contact

  • Kausik Majumdar, Chris Hobbs, Ken Matthews, Chien-Hao Chen, Tat Ngai, Chang Yong Kang, Gennadi Bersuker, Saikumar Vivekanand, Martin Rodgers, Steven Gausepohl, Paul D. Kirsch, Raj Jammy
  • Applied Physics Letters, March 2013, American Institute of Physics
  • DOI: 10.1063/1.4796138

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1063/1.4796138

In partnership with:

Link to American Institute of Physics showcase