Device performance and bias instability of Ta doped InZnO thin film transistor as a function of process pressure

Hyun-Woo Park, Boo-Kyoung Kim, Jin-Seong Park, Kwun-Bum Chung
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4794941
The author haven't yet claimed this publicationThe author haven't yet claimed this publication