Modeling particle-induced electron emission in a simplified plasma Test Cell

Paul N. Giuliano, Iain D. Boyd
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4794849

DSMC-PIC simulation of secondary electron emission

The author haven't finished explaining this publicationThe author haven't finished explaining this publication
The following have contributed to this page: Paul Giuliano