Effects of deep-level dopants on the electronic potential of thin Si pn junctions observed by Kelvin probe force microscope

  • Roland Nowak, Daniel Moraru, Takeshi Mizuno, Ryszard Jablonski, Michiharu Tabe
  • Applied Physics Letters, February 2013, American Institute of Physics
  • DOI: 10.1063/1.4794406

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http://dx.doi.org/10.1063/1.4794406

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