Charge deep-level transient spectroscopy of SiO2 and Al2O3 layers with embedded Ge nanocrystals

I. V. Antonova, V. I. Popov, S. A. Smagulova, J. Jedrzejewski, I. Balberg
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4793586
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