1/f noise analysis of replacement metal gate bulk p-type fin field effect transistor

Jae Woo Lee, Moon ju Cho, Eddy Simoen, Romain Ritzenthaler, Mitsuhiro Togo, Guillaume Boccardi, Jerome Mitard, Lars-Åke Ragnarsson, Thomas Chiarella, Anabela Veloso, Naoto Horiguchi, Aaron Thean, Guido Groeseneken
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4793306