Probing nanowire edge roughness using an extended magnetic domain wall

  • K. J. O'Shea, J. Tracey, S. Bramsiepe, R. L. Stamps
  • Applied Physics Letters, February 2013, American Institute of Physics
  • DOI: 10.1063/1.4792314

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http://dx.doi.org/10.1063/1.4792314

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