Experimental evidence and modeling of two types of electron traps in Al2O3 for nonvolatile memory applications

L. Sambuco Salomone, J. Lipovetzky, S. H. Carbonetto, M. A. García Inza, E. G. Redin, F. Campabadal, A. Faigón
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4792038