Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum

Keigo Suzuki, Takafumi Okamoto, Hiroyuki Kondo, Nobuhiko Tanaka, Akira Ando
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4791714