Nanoparticles charge response from electrostatic force microscopy

  • A. Mottaghizadeh, P. L. Lang, L. M. Cui, J. Lesueur, J. Li, D. N. Zheng, V. Rebuttini, N. Pinna, A. Zimmers, H. Aubin
  • Applied Physics Letters, February 2013, American Institute of Physics
  • DOI: 10.1063/1.4790587

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http://dx.doi.org/10.1063/1.4790587

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