X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

C. Raisch, C. Langheinrich, R. Werner, R. Kleiner, D. Koelle, M. Glaser, T. Chassé, A. Chassé
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4789988