Electron beam collimation with a 40 000 tip metallic double-gate field emitter array and in-situ control of nanotip sharpness distribution

P. Helfenstein, V. A. Guzenko, H.-W. Fink, S. Tsujino
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4788998
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The following have contributed to this page: Soichiro Tsujino