X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2−xO3 (x = 0–2) films on Si (111)

G. Niu, M. H. Zoellner, P. Zaumseil, A. Pouliopoulos, F. d'Acapito, T. Schroeder, F. Boscherini
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4788982
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The following have contributed to this page: Federico Boscherini