E1/E2 traps in 6H-SiC studied with Laplace deep level transient spectroscopy

  • A. Koizumi, V. P. Markevich, N. Iwamoto, S. Sasaki, T. Ohshima, K. Kojima, T. Kimoto, K. Uchida, S. Nozaki, B. Hamilton, A. R. Peaker
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4788814

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