Electrical and chemical characteristics of probe-induced two-dimensional SiOx protrusion layers

Jin-Han Lin, Hsien-Che Chiu, Yu-Rong Lin, Teng-Kai Wen, Ranjit A. Patil, Rupesh S. Devan, Chia-Hao Chen, Hung-Wei Shiu, Yung Liou, Yuan-Ron Ma
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4776696

The following have contributed to this page: Rupesh Devan