Planar defects, dislocations, and coherently scattering-size in GdBa2Cu3O7−x high-Tc thin films determined by high resolution X-ray diffraction

Gábor Csiszár, Xiao-Fen Li, Gyula Zilahi, Levente Balogh, Tamás Ungár
  • Journal of Applied Physics, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4775753