Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy

  • Masanao Ito, Kei Kobayashi, Yuji Miyato, Kazumi Matsushige, Hirofumi Yamada
  • Applied Physics Letters, January 2013, American Institute of Physics
  • DOI: 10.1063/1.4774265

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http://dx.doi.org/10.1063/1.4774265

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