Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors

  • Sheng-Yao Huang, Ting-Chang Chang, Man-Chun Yang, Li-Wei Lin, Ming-hsin Wu, Kai-Hsiang Yang, Min-Chen Chen, Yi-Jen Chiu, Bo-Liang Yeh
  • Applied Physics Letters, December 2012, American Institute of Physics
  • DOI: 10.1063/1.4772485

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http://dx.doi.org/10.1063/1.4772485

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