Combined cross sectional scanning tunneling microscopy and high resolution x-ray diffraction study for quantitative structural descriptions of type-II superlattice infrared detectors

M. K. Yakes, S. B. Qadri, N. A. Mahadik, C. Yi, D. Lubyshev, J. M. Fastenau, A. W. K. Liu, E. H. Aifer
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4770296
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