Band bending and determination of band offsets in amorphous/crystalline silicon heterostructures from planar conductance measurements

R. Varache, J. P. Kleider, W. Favre, L. Korte
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4769736
The author haven't yet claimed this publicationThe author haven't yet claimed this publication