On the origin of basal stacking faults in nonpolar wurtzite films epitaxially grown on sapphire substrates

P. Vennéguès, J. M. Chauveau, Z. Bougrioua, T. Zhu, D. Martin, N. Grandjean
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4768686
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The following have contributed to this page: Jean-Michel Chauveau