Observation of the generation of stacking faults and active degradation measurements on off-axis and on-axis 4H-SiC PiN diodes

  • N. Thierry-Jebali, J. Hassan, M. Lazar, D. Planson, E. Bano, A. Henry, E. Janzén, P. Brosselard
  • Applied Physics Letters, November 2012, American Institute of Physics
  • DOI: 10.1063/1.4768440

The authors haven't yet claimed this publication.

Read Publication

http://dx.doi.org/10.1063/1.4768440

In partnership with: