The impact of the stress induced by lateral spatial hole burning on the degradation of broad-area AlGaAs/GaAs laser diodes

Yanbin Qiao, Shiwei Feng, Cong Xiong, Xiaoyu Ma, Hui Zhu, Chunsheng Guo, Guanghua Wei
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4768194