Nanotwins and stacking faults in high-strength epitaxial Ag/Al multilayer films

  • D. Bufford, Z. Bi, Q. X. Jia, H. Wang, X. Zhang
  • Applied Physics Letters, November 2012, American Institute of Physics
  • DOI: 10.1063/1.4768000

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http://dx.doi.org/10.1063/1.4768000

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