Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device

Knut Müller, Henning Ryll, Ivan Ordavo, Sebastian Ihle, Lothar Strüder, Kerstin Volz, Josef Zweck, Heike Soltau, Andreas Rosenauer
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4767655
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