Indium incorporation efficiency and critical layer thickness of (202¯1) InGaN layers on GaN

  • Simon Ploch, Tim Wernicke, Martin Frentrup, Markus Pristovsek, Markus Weyers, Michael Kneissl
  • Applied Physics Letters, November 2012, American Institute of Physics
  • DOI: 10.1063/1.4767336

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The following have contributed to this page: Prof. Dr. Markus Weyers