Characterization of the state of a droplet on a micro-textured silicon wafer using ultrasound

N. Saad, R. Dufour, P. Campistron, G. Nassar, J. Carlier, M. Harnois, B. Merheb, R. Boukherroub, V. Senez, J. Gao, V. Thomy, M. Ajaka, B. Nongaillard
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4767223