In situ investigation of ion-induced dewetting of a thin iron-oxide film on silicon by high resolution scanning electron microscopy

S. Amirthapandian, F. Schuchart, D. Garmatter, W. Bolse
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4767068
The author haven't yet claimed this publicationThe author haven't yet claimed this publication