Nonlinear dependence of set time on pulse voltage caused by thermal accelerated breakdown in the Ti/HfO2/Pt resistive switching devices

M. G. Cao, Y. S. Chen, J. R. Sun, D. S. Shang, L. F. Liu, J. F. Kang, B. G. Shen
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4766737
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