In situ x-ray diffraction of solution-derived ferroelectric thin films for quantitative phase and texture evolution measurement

Krishna Nittala, Sungwook Mhin, Jacob L. Jones, Douglas S. Robinson, Jon F. Ihlefeld, Geoff L. Brennecka
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4766387