Can interference patterns in the reflectance spectra of GaN epilayers give important information of carrier concentration?

S. J. Xu, F. Zhang, J. Q. Ning, D. G. Zhao, H. Yang, C. M. Che, C. C. Zheng
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4766188