Can interference patterns in the reflectance spectra of GaN epilayers give important information of carrier concentration?

  • C. C. Zheng, S. J. Xu, F. Zhang, J. Q. Ning, D. G. Zhao, H. Yang, C. M. Che
  • Applied Physics Letters, November 2012, American Institute of Physics
  • DOI: 10.1063/1.4766188

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http://dx.doi.org/10.1063/1.4766188

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