Indicators of mobility extraction error in bottom gate CdS metal-oxide-semiconductor field-effect transistors

  • Ukjin Jung, Young Gon Lee, Jin Ju Kim, Sang Kyung Lee, I. Mejia, A. Salas-Villasenor, Manuel Quevedo-Lopez, Byoung Hun Lee
  • Applied Physics Letters, October 2012, American Institute of Physics
  • DOI: 10.1063/1.4765067

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http://dx.doi.org/10.1063/1.4765067

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