An investigation of the Young's modulus of single-crystalline wurtzite indium nitride using an atomic force microscopy based micromechanical bending test

Yen-Sheng Lu, Chih-Hung Hsieh, Shangjr Gwo, Max T. Hou, Jung-Sheng Yao, J. Andrew Yeh
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4763459
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