Atomic-resolution study of polarity reversal in GaSb grown on Si by scanning transmission electron microscopy

S. Hosseini Vajargah, S. Y. Woo, S. Ghanad-Tavakoli, R. N. Kleiman, J. S. Preston, G. A. Botton
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4759160
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