Investigation of vertically trapped charge locations in Cr-doped-SrTiO3-based charge trapping memory devices

Yujeong Seo, Min Yeong Song, Ho-Myoung An, Yeon Soo Kim, Bae Ho Park, Tae Geun Kim
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4757413